Several Variations Of Electron Microscopes

There are 3 variations of electron microscopes that are commonly used. They can be transmission electron microscopy TEM and scanning electron microscopy SEM. TEM was first developed by Ernst Ruska and Max Knoll. They were 3 researchers from Germany in 1932. At that time, Ernst Ruska was a doctoral student and Max Knoll was his adviser.

Due to the fact that the findings were surprising within the world, Ernst Ruska was awarded the Nobel Prize in Physics in 1986. As the name implied, TEM worked together with the principle of firing electrons into a thin layer samples, then distant facts related to the composition structure regarding the sample should be detected from the analysis regarding the nature regarding the collision, the reflection and the phase of electron beam that penetrated the thin layer. From the reflectance characteristic regarding the electron beam, you should also have knowledge of the crystal structure and its direction. Even, from a more detailed analysis, you should view row of atom structure and absence of defects on the structure. Just kept in mind, for this TEM observation, the sample should be diluted, such that the thickness was thinner than 100 nanometers.

And, this was not an easy job. In this case, you wanted special expertise and equipment. The objects that should not be thinned should be processed by the TEM difficultly. Within the manufacture of electronic devices, TEM was many times used to observe the cross section or slice devices and the characteristics of crystal in these devices. In other cases, TEM was also used to observe the slice of surface regarding the device.