Atomic Force Microscopy

Atomic Force Microscopy, also known as Scanning force microscopy, is an above resolution scanning probe microscopy. It offers optimum position of imaging function with a resolution of fractions of a nanometer, that is over 1000 times more effective than the optical diffraction limit. Application of atom structure in Ophthalmology or Contact Lens Manufacturing:. AFM's optimum quality resolution creates it likely to image and measure the features on the order of as fewer like a little nanometers. AFM has the capability of characterizing contact lenses in their characteristic liquid environment.

A notable benefit of this technique is that it should be used to examine soft contact lenses' surfaces in a hydrated as well like a dehydrated state. Besides, AFM is one regarding the safest techniques applied in contact lens manufacturing, as it characterizes the contact lenses without causing any kind of damage. Application of Atomic Force Microscopy in food science:. Atomic force microscopy offers an effective method for the detection of nanoscale structural information. AFM can help a best deal in critical insights on food properties.

Analysis done through AFM should be helpful in illustrating property changes receiving location in food during processing and storage. This in turn shall release a more comprehensive knowledge regarding the food properties at macromolecular levels, thereby helping to improve the technologies associated with food processing and storage. Application of Atomic Force Microscopy in Biology:. AFM should be an moral method to learn regarding the subcellular structures and biomolecules. Since the atomic force microscope, in a physiological environment, can image the 3-D structure of a biological specimen, it creates it likely to monitor real-time physiological and biochemical processes at a resolution that is similar to that obtained by creating use of an electron microscope.

Modes of operation: AFMs are very versatile and like a result they can be applied to a large many studies topics and have also been modified to suit different applications. Little of these with tapping mode AFM, Phase Imaging and Force Modulation.